SEM - Scanning Elektron Microscopy
Using scanning electron microscopy, we can perform
- Microstructural analysis
- Metallography using backscatter and secondary electron images
- Texture analysis using electron backscatter diffraction (EBSD)
- Mineral and crystal iteration analyses
- Electron Backscatter Diffraction (EBSD) images can be quantitatively evaluated upon request (e.g. particle analysis, grain size, grain boundary orientation, porosity and crack distribution in 2D).
- EDX (Energy Dispersive X-Ray) can be used to determine element distributions in profiles or grid analyses (e.g. for damage analysis).
- In addition to global texture analysis, EBSD can be used to obtain locally resolved crystal orientations with a resolution of 500 nm.